Yekan Vibration Proximity Probe — Static Calibration

Interactive micrometer test rig · Fixed probe · Moving AISI 4140 target · Measurements, chart, ISF & ASF

Test Mechanism Fixed Probe / Moving Target

Fixed Probe (CAD)AISI 4140Micrometer HeadZero ContactTarget retracts to the right →0 mil | 0.000 mm
Interval ISF — Measured vs. Nominal
━━ Nominal ISF● Measured ISF
Gap (mil)0
Micrometer (mm)0.000
Measured Voltage (V)—
Reference Voltage (V)—

Test Settings

Enter measured voltages below as positive or negative values. The chart and ISF / ASF calculations use voltage magnitude.

Demo values are illustrative, not measured data. Zero contact is excluded from the 10–90 mil linearity analysis.

Measured Test Data

Gap (mil)Micrometer (mm)Measured Voltage (VDC)Reference (VDC)Interval ISF (mV/mil)ISF Error (%)
Measured ASF—mV/mil
ASF Error—Percent
Data Points0 / 9
Max |ISF Error|—Percent

Interval ISF = change in voltage magnitude / 10 mil. ASF = slope between the first and last measured points (80 mil when both 10 and 90 mil are present). Interval ISF is computed only when both adjacent readings exist.

Voltage vs. Gap

━━ Nominal Reference━━ Measurements● Selected Position

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